[Course on line RISIS]- Thematic and spatial analysis of technologies using Cortext and RISIS patent database by LISIS – UGE Paris between 8h and 10th of November 2021.
The framework of the RISIS project (http://risis2.eu/), a course « Thematic and spatial analysis of technologies using Cortext and RISIS patent database » will be organized by LISIS – UGE Paris between 8h and 10th of November 2021.
This course aims at providing methodological and practical skills to analyse patent documents. It relies on the facilities available at UGE in Paris, the RISIS Patent Database and the Cortext tool. The workshop will be centred on two dimensions of the technology analyses using patents: network analysis and geography. The course will be divided into teaching and training sessions with practical treatment of data related to research outputs.
This course is free of charge. It will be held online.
Interested participants are kindly requested to send an e-mail to patricia.laurens@esiee.fr before the 31th of October describing your motivations and including a short bio.
More information on RISIS training activities and upcoming course can be found on the following URL: